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IDT'08
Program Committe
The Program Committee
consists of leading researchers in the fields of design and testing from
all over the world.
PROGRAM CO-CHAIRS
Loulou M. –
University of Sfax, Tunisia
Salem
A.
– Egypt
Ivanov
A.
– Canada
VICE-PROGRAM CO-CHAIRS
Alhumaidi S. - KSA
Besbes K. -Tunisia
Ben Saoud S. -Tunisia
MEMBERS
|
A.J Al-Yamani A. |
KFUPM, KSA |
|
Abd-El-Barr M. |
Kuwait University,Kuwait |
|
Abdelkrim O. |
CDTA, Algeria |
|
Abraham J. A. |
UT at Austin, USA |
|
Adham S. |
LogicVision, USA |
|
Akil M. |
ESIEE, France |
|
AL Hammadi H. |
Etisalat, UAE |
|
Al-Ars Z. |
Delft University, Netherlands |
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Al-Failakawi M. |
Kuwait University, Kuwait |
|
Al-Hashimi B. |
University of Southampton,UK |
|
Aloul F. |
AUS, UAE |
|
Arabi K. |
PMC Sierra, USA |
|
Ashraf S. |
Ain Chams University |
|
Auguin M. |
I3S, France |
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Bastaki E. |
Dubai Silicon Oasis, UAE |
|
Beiu V. |
UAE University, UAE |
|
Borrione D. |
TIMA Laboratory, France |
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Chehab A. |
AUB, Lebanon |
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Courtois B. |
CMP, France |
|
Daniel P. |
ENSEA, France |
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De Micheli G. |
EPFL,Switzerland |
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Deforges O. |
INSA Rennes, France |
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Dekeyser J-L |
LIFL, France |
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ElAyat K. |
AUC, Egypt |
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Eleuldj M. |
EMI, Maroc |
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ElHennawy H. |
Ain Shams University, Egypt |
|
Elmostapha A. |
Montreal University, Canada |
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Elsimary H. |
ERI, Egypt |
|
Fikry H. |
UFE, Egypt |
|
Gamal M-A. |
SECC, Egypt |
|
Ghazel A. |
SUPCOM, Tunisia |
|
Ghonaimy A. |
Ain Shams University, Egypt |
|
Gogniat G. |
UBS, France |
|
Goren S. |
Bahcesehir University, Turkey |
|
Granado B. |
ENSEA, France |
|
H. El-Maleh A. |
KFUPM, KSA |
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Habib S. |
Cairo University, Egypt |
|
Hafed M. |
DFT Microsystems, Canada |
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Hamdioui S. |
Delft University, Netherlands |
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Hammami O. |
ENSTA, France |
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Hasnaoui S. |
ENIT, Tunisia |
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Hayes J-P. |
Michigan University, USA |
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Ismail M. |
Analog VLSI Lab, USA |
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Ismail Y. |
Northwestern University, USA |
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Ivanov A. |
UBC, Canada |
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Kammoun L. |
ENIS, Tunisia |
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Kanoun O. |
ETIT, Germany |
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Keezer D. |
Georgia Tech, USA |
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Khalgui M. |
MLU, Germany |
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Koubaa A. |
IMAMU, KSA |
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Kurdahi F. |
UCI, USA |
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Laroussi B. |
ST Microelectronics, France |
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Loumeau P. |
ENST, France |
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Makki R. |
UAE University, UAE |
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Masmoudi N. |
ENIS, Tunisia |
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Massoud Y. |
Rice University, USA |
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Mehrez H. |
LIP6, France |
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Mirabbasi S. |
UBC, Canada |
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Mohammed A. Z. |
ERI, Egypt |
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Mouine J. |
ENIT, Tunisia |
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Mourad S. |
Santa Clara University, USA |
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Niar S. |
LAMIH, France |
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Nourani M. |
UTD, USA |
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Obeid A. M. |
KACST, KSA |
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Paindavoine M. |
LE2I, France |
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Pedram M. |
SCU, USA |
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Philippe Diguet J. |
UBS, France |
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Piguet C. |
CSEM, Belgique |
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Ravikumar C.P. |
Texas Instruments, India |
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Reda S. |
Brown University, USA |
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Robbana R. |
EPT, Tunisia |
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Roy K. |
Purdue University, USA |
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Sabry N. |
UFC, Egypt |
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Samet A. |
University of Carthage, Tunisia |
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Sellami Masmoudi D. |
ENIS, Tunisia |
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Sentiyes O. |
IRISA, France |
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Simonot-Lion F. |
LORIA, France |
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Slama I. |
ENIT, Tunisia |
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Slamani M. |
IBM, USA |
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Tahar S. |
Concordia University, Canada |
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Tantawy A. N. |
IBM, USA |
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Tehranipoor M. |
Connecticut University, USA |
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Tovar E. |
IPP, Portogal |
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Valderrama C. |
Faculty of Engineering – Belgium |
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Williams T. |
Synopsys, USA |
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Wunderlich H-J. |
Stuttgart University, Germany |
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XU Q. |
CUHK, Hong Kong |
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Youssef H. |
Sousse University, Tunisia |
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Zilic Z. |
McGill University, Canada |
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