3rd International Design and Test
Workshop
IDT’08 Monastir, Tunisia
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Important dates Submission deadline 9th October 2008
Notification of acceptance 5th November 2008
Final version 21st November 2008
Registration deadline 21st November 2008
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Special issues in scientific journals
A selection of best papers will be included in :
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1. A special edition of the Analog Integrated Circuits and Signal Processing: the International Journal Springer US
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2. A normal edition of the IEEE Design & Test of Computers (the best three papers) |
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The selection will be done in two steps. The first step will be in the initial reviewing process of the Conference. The second will be done during the paper presentation in the Conference by the respective Session Chair
The authors of the selected papers will be notified to submit a more complete version of their papers. These submitted papers will go through a separate and final journal reviewing process, after which the accepted papers will be included in one of the two above Scientific Journals..