3rd International Design and Test
Workshop
IDT’08 Monastir, Tunisia
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Important dates Submission deadline 9th October 2008
Notification of acceptance 5th November 2008
Final version 21st November 2008
Registration deadline 21st November 2008
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Workshop Topics
Topics include, but
are not limited to, the following:Design Methods and Tools:
System Specification and
Modelling
System Design Methods
SOC/NOC/MPSOC design issues
Quantum Computing
MEMs
Architectures and Nanotechnology architectures
Reconfigurable Computing
Emerging Technologies, Systems and Applications
Architectural and Logic synthesis
Design of Low Power Systems and Power analysis
Packaging
Design verification and Formal Methods
Mixed-signal and RF design
IC physical design automation
Design for manufacturability
Test Methods and Tools:
Test Generation,
Simulation and Diagnosis
Design For Test
iDDQ and iDDT testing
Defect-based test
Fault modeling
Test issues in nanotechnology
Built-In Self Test (BIST)
Design for manufacturability (DFM)
Memory and FPGA test and repair
Automatic test equipment
Analog and mixed-signal test
On-line testing
Test resource partitioning
Failure analysis
Fault tolerance
Economics of test
Applications design
Embedded systems
Real-time systems
Multi-core Platforms
Media system
Signal Processing
Wireless Communication and Networking
Automotive
Military
Secure Embedded Implementations
etc.